Optical Materials & Thin-Film Analysis Tools
Tools for refractive-index dispersion fitting, index profiling, and thin-film mode analysis
Cauchy Fit
Fit multi-wavelength refractive-index data to the Cauchy dispersion equation and obtain the material dispersion curve.
Sellmeier Fit
Fit multi-wavelength refractive-index data to the Sellmeier dispersion equation to characterize material dispersion.
Refractive Index Profile
Reconstruct the refractive-index depth profile from effective-index data and generate a 2D index distribution map.
Mode Calculator
Calculate the effective indices and modal parameters of guided modes from the film refractive index and thickness.