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OP-7000
OP-7000

OP-8000

It uses the prism coupling principle to measure material parameters such as refractive index, film thickness, waveguide loss, and thermo-optic coefficient.

Category:
Technical Parameters

Technical Parameters

Parameter nameValue and range
Test wavelength266–1650 nm (6 selectable wavelengths)
Refractive index accuracy±0.0005
Refractive index resolution±0.0003
Refractive index measurement range1.0-1.8
1.8-2.4
2.4-3.35 (optional prism)
Thickness accuracy± (0.5% + 50 Å)
Thickness resolution± 0.3%
Film thickness measurement range0.4 - 150 µm
Waveguide loss measurement range0.05-50dB/cm
Waveguide loss accuracy± 5% (i.e. 1dB/cm, measurement error ±0.05 dB/cm)
Sample sizeMinimum 3 mm*3 mm
Maximum 50 mm*50 mm
Base thickness: ＜ 1 mm
Sample Rotating Stage-90° ~ 90°
Optional variable temperature systemTemperature range: room temperature - 200°C

Description

Product Features

●High-precision measurement of thin-film optical refractive index and film thickness.

●High-precision measurement of refractive index for bulk materials or substrate materials.

●Capability to measure film thickness and refractive index in single-layer/double-layer film structures.

●Unique air-pressure coupling method, eliminating the need for coupling liquid.

●Material dispersion equation fitting.

●Equipped with “Analysis” function to obtain refractive index data at different wavelengths or temperatures.

●Applicable for measuring anisotropic/birefringent materials (TE & TM modes).

●Multiple laser source options available (standard configuration: 405–1550 nm; optional configurations: 375 nm, 266 nm).

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