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Optical materials & waveguide analysis
Optical Material & Thin-Film Analysis Tools
Dispersion fitting, index profiling and thin-film mode analysis
Cauchy Fit
Fit the Cauchy dispersion equation from multi-wavelength refractive index data.
Sellmeier Fit
Fit Sellmeier coefficients to characterize material dispersion.
Index Profile
Reconstruct index–depth profiles from effective index data and plot 2D maps.
Mode Calculator
Compute effective indices and mode parameters from film index and thickness.
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