Product Features
●High-precision measurement of thin-film optical refractive index and film thickness.
●High-precision measurement of refractive index for bulk materials or substrate materials.
●Capability to measure film thickness and refractive index in single-layer/double-layer film structures.
●Unique air-pressure coupling method, eliminating the need for coupling liquid.
●Material dispersion equation fitting.
●Equipped with “Analysis” function to obtain refractive index data at different wavelengths or temperatures.
●Applicable for measuring anisotropic/birefringent materials (TE & TM modes).
●Multiple laser source options available (standard configuration: 405–1550 nm; optional configurations: 375 nm, 266 nm).